Browse by Authors and EditorsJump to: Article | Book Section Number of items: 6. ArticleFay, Mike W., Han, Y., Brown, Paul D., Harrison, Ian, Hilton, K.P., Munday, A., Wallis, D., Balmer, R.S., Uren, M.J. and Martin, T. (2008) Structural and electrical characterization of AuPtAlTi ohmic contacts to AlGaN/GaN with varying annealing temperature and Al content. Journal of Applied Physics, 103 (7). 074501. ISSN 0021-8979 Book SectionMoldovan, Grigore, Harrison, Ian, Roe, Martin and Brown, Paul D. (2004) Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN. In: Electron microscopy and analysis 2003: proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003. Institute of Physics conference series (179). Institute of Physics Publishing, Bristol, pp. 115-118. ISBN 0750309679 Fay, Mike W., Harrison, Ian, Larkins, Eric C., Novikov, Sergei V., Foxon, C.T. and Brown, Paul D. (2004) TEM assessment of As-doped GaN epitaxial layers grown on sapphire. In: Electron Microscopy and Analysis 2003: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003. Institute of Physics conference series (179). Institute of Physics Publishing, Bristol, pp. 23-26. ISBN 0750309679 Moldovan, Grigore, Harrison, Ian and Brown, Paul D. (2003) EBIC study of Au / n-type GaN Schottky contacts. In: Microscopy of semiconducting materials 2003 : proceedings of the Institute of Physics conference, Cambridge University, 31 March - 3 April 2003. Institute of Physics conference series (180). IOP Publishing Ltd, Bristol, pp. 577-580. ISBN 9780750309790 Fay, Mike W., Moldovan, Grigore, Harrison, Ian, Balmer, R.S., Soley, D.E.J., Hilton, K.P., Hughes, B.T., Uren, M.J., Martin, T. and Brown, Paul D. (2003) TEM studies of multilayer ohmic contacts to n-type AlGaN/GaN. In: Microscopy of semiconducting materials 2003: proceedings of the Institute of Physics conference, Cambridge University, 31 March - 3 April. Institute of Physics conference series (180). IOP Publishing Ltd, Bristol, pp. 483-486. ISBN 9780750309790 Fay, Mike W., Harrison, Ian, Birbeck, J.C., Hughes, B.T., Uren, M.J., Martin, T. and Brown, Paul D. (2001) Microstructural characterisation of TiAlTiAu and TiAlPdAu ohmic contacts to AlGaN/GaN. In: Electron microscopy and analysis 2001: proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Dundee, 5-7 September. Institute of Physics conference series (168). IOP Publishing Ltd, Bristol, pp. 497-500. ISBN 9780750308120 |