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Jump to: Article | Conference or Workshop Item Number of items: 4. ArticleRajaguru, P., Lu, H., Bailey, C., Castellazzi, A., Pathirana, V., Udugampola, N. and Udrea, F. (2018) Impact of underfill and other physical dimensions on Silicon Lateral IGBT package reliability using computer model with discrete and continuous design variables. Microelectronics Reliability, 83 . pp. 146-156. ISSN 0026-2714 Fayyaz, A. and Castellazzi, A. (2015) High temperature pulsed-gate robustness testing of SiC power MOSFETs. Microelectronics Reliability, 55 (9-10). pp. 1724-1728. ISSN 0026-2714 Conference or Workshop ItemZeng, Y., Hussein, A. and Castellazzi, A. (2018) Individual device active cooling for enhanced system-level power density and more uniform temperature distribution. In: 2018 IEEE 30th International Symposium on Power Semiconductor Devices and ICs (ISPSD), 13-17 May 2018, Chicago, USA. Wu, H, Garcia, J. and Castellazzi, A. (2018) GaN HEMT gate-driver for achieving high power converter integration levels. In: 9th International Conference on Power Electronics, Machines and Drives (PEMD 2018), 17-19 April 2018, Liverpool, UK. |
