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Fay, Mike W. and Harrison, Ian and Birbeck, J.C. and Hughes, B.T. and Uren, M.J. and Martin, T. and Brown, Paul D. (2001) Microstructural characterisation of TiAlTiAu and TiAlPdAu ohmic contacts to AlGaN/GaN. In: Electron microscopy and analysis 2001: proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Dundee, 5-7 September. Institute of Physics conference series (168). IOP Publishing Ltd, Bristol, pp. 497-500. ISBN 9780750308120

Fay, Mike W. and Han, Y. and Brown, Paul D. and Harrison, Ian and Hilton, K.P. and Munday, A. and Wallis, D. and Balmer, R.S. and Uren, M.J. and Martin, T. (2008) Structural and electrical characterization of AuPtAlTi ohmic contacts to AlGaN/GaN with varying annealing temperature and Al content. Journal of Applied Physics, 103 (7). 074501. ISSN 0021-8979

Fay, Mike W. and Moldovan, Grigore and Harrison, Ian and Balmer, R.S. and Soley, D.E.J. and Hilton, K.P. and Hughes, B.T. and Uren, M.J. and Martin, T. and Brown, Paul D. (2003) TEM studies of multilayer ohmic contacts to n-type AlGaN/GaN. In: Microscopy of semiconducting materials 2003: proceedings of the Institute of Physics conference, Cambridge University, 31 March - 3 April. Institute of Physics conference series (180). IOP Publishing Ltd, Bristol, pp. 483-486. ISBN 9780750309790

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