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Number of items: 9.

Kong, Chang-Jing and Moldovan, Grigore and Fay, Mike W. and McCartney, D. Graham and Brown, Paul D. (2004) Characterisation of dispersions within annealed HVOLF thermally sprayed AlSnCu coatings. In: Electron Microscopy and Analysis 2003: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003. Institute of Physics conference series (179). Institute of Physics Publishing, Bristol, pp. 245-248. ISBN 0750309679

Fay, Mike W. and Harrison, Ian and Birbeck, J.C. and Hughes, B.T. and Uren, M.J. and Martin, T. and Brown, Paul D. (2001) Microstructural characterisation of TiAlTiAu and TiAlPdAu ohmic contacts to AlGaN/GaN. In: Electron microscopy and analysis 2001: proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Dundee, 5-7 September. Institute of Physics conference series (168). IOP Publishing Ltd, Bristol, pp. 497-500. ISBN 9780750308120

Fay, Mike W. and Han, Y. and Novikov, Sergei V. and Edmonds, K.W. and Gallagher, B.L. and Campion, R.P. and Staddon, C.R. and Foxon, C.T. and Brown, Paul D. (2008) Nanoscale characterisation of MBE-grown GaMnN / (001) GaAs. In: Microscopy of semiconducting materials 2007: proceedings of the 15th conference, 2-5 April 2007, Cambridge, UK. Springer proceedings in physics (120). Springer-Verlag, Dordrecht, pp. 103-106. ISBN 9781402086144

Fay, Mike W. and Han, Y. and Brown, Paul D. and Harrison, Ian and Hilton, K.P. and Munday, A. and Wallis, D. and Balmer, R.S. and Uren, M.J. and Martin, T. (2008) Structural and electrical characterization of AuPtAlTi ohmic contacts to AlGaN/GaN with varying annealing temperature and Al content. Journal of Applied Physics, 103 (7). 074501. ISSN 0021-8979

Han, Y. and Fay, Mike W. and Brown, Paul D. and Novikov, Sergei V. and Edmonds, K.W. and Gallagher, B.L. and Campion, R.P. and Foxon, C.T. (2005) Structural characterisation of MBE grown zinc-blende Ga1-xMnxN/GaAs(001) as a function of Ga flux. In: Microscopy of semiconducting materials: proceedings of the 14th conference: April 11-14, 2005, Oxford, UK. Springer proceedings in physics (107). Springer-Verlag, Berlin, pp. 155-158. ISBN 9783540319146

Edwards, H.K. and Fay, Mike W. and Bououdina, M. and Gregory, D.H. and Walker, G.S. and Brown, Paul D. (2004) Structural characterisation of carbon nanotubes in the presence of a Ni catalyst. In: Electron Microscopy and Analysis 2003: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003. Institute of Physics conference series (179). Institute of Physics Publishing, Bristol, pp. 447-450. ISBN 0750309679

Fay, Mike W. and Han, Y. and Novikov, Sergei V. and Edmonds, K.W. and Wang, K. and Gallagher, B.L. and Campion, R.P. and Foxon, C.T. and Brown, Paul D. (2005) Structural characterisation of spintronic GaMnAs and GaMnN heterostructures grown by molecular beam epitaxy. In: Microscopy of semiconducting materials: proceedings of the 14th conference: April 11-14, 2005, Oxford, UK. Springer proceedings in physics (107). Springer-Verlag, Berlin, pp. 143-146. ISBN 9783540319146

Fay, Mike W. and Harrison, Ian and Larkins, Eric C. and Novikov, Sergei V. and Foxon, C.T. and Brown, Paul D. (2004) TEM assessment of As-doped GaN epitaxial layers grown on sapphire. In: Electron Microscopy and Analysis 2003: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003. Institute of Physics conference series (179). Institute of Physics Publishing, Bristol, pp. 23-26. ISBN 0750309679

Fay, Mike W. and Moldovan, Grigore and Harrison, Ian and Balmer, R.S. and Soley, D.E.J. and Hilton, K.P. and Hughes, B.T. and Uren, M.J. and Martin, T. and Brown, Paul D. (2003) TEM studies of multilayer ohmic contacts to n-type AlGaN/GaN. In: Microscopy of semiconducting materials 2003: proceedings of the Institute of Physics conference, Cambridge University, 31 March - 3 April. Institute of Physics conference series (180). IOP Publishing Ltd, Bristol, pp. 483-486. ISBN 9780750309790

This list was generated on Wed Oct 22 10:37:44 2014 IST.