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Fayyaz, A. and Romano, G. and Castellazzi, A. (2016) Body diode reliability investigation of SiC power MOSFETs. Microelectronics Reliability, 64 . pp. 530-534. ISSN 0026-2714

Fayyaz, A. and Castellazzi, A. (2015) High temperature pulsed-gate robustness testing of SiC power MOSFETs. Microelectronics Reliability, 55 (9-10). pp. 1724-1728. ISSN 0026-2714

Giuliani, F. and Dipankar, D. and Delmonte, N. and Castellazzi, A. and Cova, P. (2014) Robust snubberless soft-switching power converter using SiC power MOSFETs and bespoke thermal design. Microelectronics Reliability, 54 (9-10). pp. 1916-1920. ISSN 0026-2714

Fayyaz, A. and Yang, L. and Riccio, M. and Castellazzi, A. and Irace, A. (2014) Single pulse avalanche robustness and repetitive stress ageing of SiC power MOSFETs. Microelectronics Reliability, 54 (9-10). pp. 2185-2190. ISSN 0026-2714

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