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Rajaguru, P. and Lu, H. and Bailey, C. and Castellazzi, A. and Pathirana, V. and Udugampola, N. and Udrea, F. (2018) Impact of underfill and other physical dimensions on Silicon Lateral IGBT package reliability using computer model with discrete and continuous design variables. Microelectronics Reliability, 83 . pp. 146-156. ISSN 0026-2714

Fayyaz, A. and Castellazzi, A. (2015) High temperature pulsed-gate robustness testing of SiC power MOSFETs. Microelectronics Reliability, 55 (9-10). pp. 1724-1728. ISSN 0026-2714

Conference or Workshop Item

Wu, H and Garcia, J. and Castellazzi, A. (2018) GaN HEMT gate-driver for achieving high power converter integration levels. In: 9th International Conference on Power Electronics, Machines and Drives (PEMD 2018), 17-19 April 2018, Liverpool, UK.

This list was generated on Thu May 24 04:03:06 2018 UTC.