Optimizing the structure of scanning probes for atomic manipulationTools Møller, Morten (2017) Optimizing the structure of scanning probes for atomic manipulation. PhD thesis, University of Nottingham.
AbstractScanning probe microscopy (SPM) allows us to directly measure the interactions between a probe and a sample at the atomic scale. Techniques such as non-contact atomic force microscopy (NC-AFM), allows us to to characterize the forces present on a surface, resolve the atomic structure of molecules or examine their chemical properties, while scanning tunneling microscopy (STM) allows their electronic properties to be characterized.
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