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Fayyaz, Asad, Castellazzi, Alberto, Romano, G., Riccio, M., Urresti, J. and Wright, N. (2017) Influence of gate bias on the avalanche ruggedness of SiC power MOSFETs. In: 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD), 28 May-1 June 2017, Sapporo, Japan.

Richens, I.F., Hobson-West, Pru, Brennan, Marnie L., Hood, Z., Kaler, Jasmeet, Green, M., Wright, N. and Wapenaar, Wendela (2016) Factors influencing veterinary surgeons’ decision-making about dairy cattle vaccination. Veterinary Record, 179 (16). p. 410. ISSN 2042-7670

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