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Number of items: 2. Vladov, Nikola, Segal, Joel and Ratchev, Svetan (2015) Apparent beam size definition of focused ion beams based on scanning electron microscopy images of nanodots. Journal of Vacuum Science & Technology B, 33 . 041803/1-041803/6. ISSN 1071-1023 Vladov, Nikola, Ratchev, Svetan and Segal, Joel (2011) Focused ion beam milling of brass for microinjection mould fabrication. In: International Conference on Micromanufacturing (ICOMM 2011), 7-10 March 2011, Tokyo, Japan. |
