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Fang, Y., Jayasuriya, D., Furniss, D., Tang, Z.Q., Sojka, Ł., Markos, C., Sujecki, S., Seddon, A.B. and Benson, T.M. (2017) Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method. Optical and Quantum Electronics . ISSN 1572-817X (In Press)

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