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2015

Bailey, James, Havelund, Rasmus, Shard, Alexander G., Gilmore, Ian S., Alexander, Morgan R., Sharp, James S. and Scurr, David J. (2015) 3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling. ACS Applied Materials & Interfaces, 7 (4). pp. 2654-2659. ISSN 1944-8244

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