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Oeder, Thorsten, Castellazzi, Alberto and Pfost, Martin (2017) Electrical and thermal failure modes of 600 V p-gate GaN HEMTs. Microelectronics Reliability, 76-77 . pp. 321-326. ISSN 0026-2714

Oeder, Thorsten, Castellazzi, Alberto and Pfost, Martin (2017) Experimental study of the short-circuit performance for a 600V normally-off p-gate GaN HEMT. In: 29th International Symposium on Power Semiconductor Devices and ICs, ISPSD 2017, 28 May-1 Jun 2017, Sapporo, Japan.

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