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Feng, Xiaobing, Lacorne, Cyril, Fernandes, Gustavo Q., Lawes, Simon and Kinnell, Peter (2016) Contamination of µCMM stylus tips: on-machine inspection. In: 16th International Conference of the European Society for Precision Engineering and Nanotechnology, 30 May - 3 June 2016, Nottingham, UK.

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