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DiSciacca, Jack, Gomez, Carlos, Thompson, Adam, Lawes, Simon, Leach, Richard, Colonna de Lega, Xavier and de Groot, Peter (2017) True-color 3D surface metrology for additive manufacturing using interference microscopy. In: Joint Special Interest Group meeting between euspen and ASPE Dimensional Accuracy and Surface Finish in Additive Manufacturing, 10-12 October 2017, Leuven, Belgium.

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