A thermal cycling reliability study of ultrasonically bonded copper wires

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Arjmand, Elaheh, Agyakwa, Pearl A., Corfield, Martin R., Li, Jianfeng, Mouawad, Bassem and Mark Johnson, C. (2016) A thermal cycling reliability study of ultrasonically bonded copper wires. Microelectronics Reliability, 59 . pp. 126-133. ISSN 0026-2714

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Official URL: http://www.sciencedirect.com/science/article/pii/S0026271416300099

Abstract

In this work we report on a reliability investigation regarding heavy copper wires ultrasonically bonded onto active braze copper substrates. The results obtained from both a non-destructive approach using 3D X-ray tomography and shear tests showed no discernible degradation or wear out from initial conditions to 2900 passive thermal cycles from − 55 to 125 °C. Instead, an apparent increase in shear strength is observed as the number of thermal cycles increases. Nanoindentation hardness investigations suggest the occurrence of cyclic hardening. Microstructural investigations of the interfacial morphologies before and after cycling and after shear testing are also presented and discussed.

Item Type:	Article
RIS ID:	https://nottingham-repository.worktribe.com/output/977208
Keywords:	Heavy copper wire bonding; Reliability; Power electronics; Passive thermal cycling; Hardness
Schools/Departments:	University of Nottingham, UK > Faculty of Engineering > Department of Electrical and Electronic Engineering
Identification Number:	10.1016/j.microrel.2016.01.009
Depositing User:	Eprints, Support
Date Deposited:	03 Oct 2016 13:06
Last Modified:	04 May 2020 20:03
URI:	https://eprints.nottingham.ac.uk/id/eprint/37320

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