Browse by Authors and Editors

[up] Up a level
Group by: Item Type | Date | No Grouping
Jump to: 2015 | 2011
Number of items: 2.

2015

Vladov, Nikola, Segal, Joel and Ratchev, Svetan (2015) Apparent beam size definition of focused ion beams based on scanning electron microscopy images of nanodots. Journal of Vacuum Science & Technology B, 33 . 041803/1-041803/6. ISSN 1071-1023

2011

Vladov, Nikola, Ratchev, Svetan and Segal, Joel (2011) Focused ion beam milling of brass for microinjection mould fabrication. In: International Conference on Micromanufacturing (ICOMM 2011), 7-10 March 2011, Tokyo, Japan.

This list was generated on Mon Dec 30 17:46:22 2024 UTC.