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Number of items: 7.

Article

Patel, Rikesh and Hirsch, Matthias and Dryburgh, Paul and Pieris, Don and Achamfuo-Yeboah, Samuel and Smith, Richard J. and Light, Roger A. and Sharples, Steve D. and Clare, Adam T. and Clark, Matt (2018) Imaging material texture of as-deposited selective laser melted parts using spatially resolved acoustic spectroscopy. Applied Sciences, 8 (10). 1991/1-1991/15. ISSN 2076-3417

Hirsch, Matthias and Dryburgh, Paul and Catchpole-Smith, Sam and Patel, Rikesh and Parry, Luke Alexander and Sharples, Steve D. and Ashcroft, Ian A. and Clare, Adam T. (2018) Targeted rework strategies for powder bed additive manufacture. Additive Manufacturing, 19 . pp. 127-133. ISSN 2214-8604

Patel, Rikesh and Li, Wenqi and Smith, Richard J. and Sharples, Steve D. and Clark, Matt (2017) Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy. Scripta Materialia, 140 . pp. 67-70. ISSN 1359-6462

Hirsch, Matthias and Catchpole-Smith, S. and Patel, R. and Marrow, P. and Li, Wenqi and Tuck, C. and Sharples, Steve D. and Clare, Adam T. (2017) Meso-scale defect evaluation of selective laser melting using spatially resolved acoustic spectroscopy. Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences, 473 (2205). pp. 1-11. ISSN 1471-2946

Hirsch, Matthias and Patel, Rikesh and Li, Wenqi and Guan, Guangying and Leach, Richard K. and Sharples, Steve D. and Clare, Adam T. (2016) Assessing the capability of in-situ nondestructive analysis during layer based additive manufacture. Additive Manufacturing . ISSN 2214-8604 (In Press)

Smith, Richard J. and Hirsch, Matthias and Patel, Rikesh and Li, Wenqi and Clare, Adam T. and Sharples, Steve D. (2016) Spatially resolved acoustic spectroscopy for selective laser melting. Journal of Materials Processing Technology, 236 . pp. 93-102. ISSN 0924-0136

Smith, Richard J. and Li, Wenqi and Coulson, Jethro and Clark, Matt and Somekh, Michael G. and Sharples, Steve D. (2014) Spatially resolved acoustic spectroscopy for rapid imaging of material microstructure and grain orientation. Measurement Science and Technology, 25 (5). 055902. ISSN 1361-6501

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