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Fang, Y. and Jayasuriya, D. and Furniss, D. and Tang, Z.Q. and Sojka, Ł. and Markos, C. and Sujecki, S. and Seddon, A.B. and Benson, T.M. (2017) Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method. Optical and Quantum Electronics . ISSN 1572-817X (In Press)

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