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Number of items: 2.

Article

Oeder, Thorsten and Castellazzi, Alberto and Pfost, Martin (2017) Electrical and thermal failure modes of 600 V p-gate GaN HEMTs. Microelectronics Reliability . ISSN 0026-2714 (In Press)

Conference or Workshop Item

Oeder, Thorsten and Castellazzi, Alberto and Pfost, Martin (2017) Experimental study of the short-circuit performance for a 600V normally-off p-gate GaN HEMT. In: 29th International Symposium on Power Semiconductor Devices and ICs, ISPSD 2017, 28 May-1 Jun 2017, Sapporo, Japan.

This list was generated on Mon Dec 11 06:02:02 2017 UTC.