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Number of items: 8.

Article

Patel, Rikesh and Li, Wenqi and Smith, Richard J. and Sharples, Steve D. and Clark, Matt (2017) Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy. Scripta Materialia, 140 . pp. 67-70. ISSN 1359-6462

Colombi, Andrea and Ageeva, Victoria and Smith, Richard J. and Clare, Adam T. and Patel, Rikesh and Clark, Matt and Colquitt, Daniel and Roux, Philippe and Guenneau, Sebastien and Craster, Richard V. (2017) Enhanced sensing and conversion of ultrasonic Rayleigh waves by elastic metasurfaces. Scientific Reports, 7 . 6750/1-6750/9. ISSN 2045-2322

Hirsch, Matthias and Patel, Rikesh and Li, Wenqi and Guan, Guangying and Leach, Richard K. and Sharples, Steve D. and Clare, Adam T. (2016) Assessing the capability of in-situ nondestructive analysis during layer based additive manufacture. Additive Manufacturing . ISSN 2214-8604 (In Press)

Smith, Richard J. and Hirsch, Matthias and Patel, Rikesh and Li, Wenqi and Clare, Adam T. and Sharples, Steve D. (2016) Spatially resolved acoustic spectroscopy for selective laser melting. Journal of Materials Processing Technology, 236 . pp. 93-102. ISSN 0924-0136

Patel, Rikesh and Achamfuo-Yeboah, Samuel and Light, Roger A. and Clark, Matt (2014) Widefield two laser interferometry. Optics Express, 22 (22). pp. 27094-27101. ISSN 1094-4087

Patel, Rikesh and Achamfuo-Yeboah, Samuel and Light, Roger and Clark, Matt (2012) Ultrastable heterodyne interferometer system using a CMOS modulated light camera. Optics Express, 20 (16). pp. 17722-17733. ISSN 1094-4087

Patel, Rikesh and Achamfuo-Yeboah, Samuel and Light, Roger and Clark, Matt (2011) Widefield heterodyne interferometry using a custom CMOS modulated light camera. Optics Express, 19 (24). pp. 24546-24556. ISSN 1094-4087

Conference or Workshop Item

Patel, Rikesh and Clark, Matt and Achamfuo-Yeboah, Samuel (2011) Widefield ultrastable heterodyne interferometry using a custom CMOS modulated light camera. In: Applied Industrial Optics: Spectroscopy, Imaging and Metrology 2011, 10–14 July 2011, Toronto, Canada.

This list was generated on Thu Oct 19 14:14:15 2017 UTC.