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Number of items: 2.

Article

Yang, Li and Li, Ke and Dai, Jingru and Corfield, Martin and Harris, Anne and Paciura, Krzysztof and O'Brien, John and Johnson, C. Mark (2018) Electrical performance and reliability characterization of a SiC MOSFET power module with embedded decoupling capacitors. IEEE Transactions on Power Electronics, 33 (12). pp. 10594-10601. ISSN 1941-0107

Conference or Workshop Item

Yang, Li and Agyakwa, Pearl and Corfield, Martin and Johnson, Mark and Harris, Anne and Packwood, Matthew and Paciura, Krzysztof (2018) Comparison of thermal and reliability performance between a SiC MOSFET module with embedded decoupling capacitors and commercial Si IGBT power modules. In: 10th International Conference on Integrated Power Electronics (CIPS 2018), 20-23 Mar 2018, Stuttgart, Germany.

This list was generated on Wed Feb 24 17:37:51 2021 UTC.