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Number of items: 1. Musallam, Mahera, Yin, Chunyan, Bailey, Chris and Johnson, C. Mark (2014) Application of coupled electro-thermal and physics-of-failure-based analysis to the design of accelerated life tests for power modules. Microelectronics Reliability, 54 (1). pp. 172-181. ISSN 0026-2714 |
