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Article

Zhang, Hui and Li, Jianfeng and Dai, Jingru and Corfield, Martin and Liu, Xuejian and Liu, Yan and Huang, Zhengren and Johnson, Christopher Mark (2017) Improved reliability of planar power interconnect with ceramic-based structure. IEEE Journal of Emerging and Selected Topics in Power Electronics . ISSN 2168-6785 (In Press)

This list was generated on Thu Oct 19 12:40:04 2017 UTC.