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Iuras, Andrea, Scurr, David J., Boissier, Catherine, Nicholas, Mark L., Roberts, Clive J. and Alexander, Morgan R. (2016) Imaging of crystalline and amorphous surface regions using time-of-flight secondary-ion mass spectrometry (ToF-SIMS): application to pharmaceutical materials. Analytical Chemistry, 88 . pp. 3481-3487. ISSN 1520-6882

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