Browse by Authors and Editors
Number of items: 2.
Castellazzi, Alberto and Fayyaz, Asad and Romano, G. and Yang, Li and Riccio, M. and Irace, A. (2016) SiC power MOSFETs performance, robustness and technology maturity. Microelectronics Reliability, 58 . pp. 164-176. ISSN 0026-2714
Fayyaz, A. and Yang, L. and Riccio, M. and Castellazzi, A. and Irace, A. (2014) Single pulse avalanche robustness and repetitive stress ageing of SiC power MOSFETs. Microelectronics Reliability, 54 (9-10). pp. 2185-2190. ISSN 0026-2714