Browse by Authors and Editors
Number of items: 1.
Bailey, James and Havelund, Rasmus and Shard, Alexander G. and Gilmore, Ian S. and Alexander, Morgan R. and Sharp, James S. and Scurr, David J. (2015) 3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling. ACS Applied Materials & Interfaces, 7 (4). pp. 2654-2659. ISSN 1944-8244