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Bailey, James and Havelund, Rasmus and Shard, Alexander G. and Gilmore, Ian S. and Alexander, Morgan R. and Sharp, James S. and Scurr, David J. (2015) 3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling. ACS Applied Materials & Interfaces, 7 (4). pp. 2654-2659. ISSN 1944-8244

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