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Number of items: 6.

Article

Krishna Kumar, R. and Mishchenko, A. and Chen, X. and Pezzini, S. and Auton, G.H. and Ponomarenko, L.A. and Zeitler, U. and Eaves, Laurence and Fal’ko, V.I. and Geim, A.K. (2018) High-order fractal states in graphene superlattices. Proceedings of the National Academy of Sciences, 115 (20). pp. 5135-5139. ISSN 1091-6490

Krishna Kumar, R. and Chen, X. and Auton, G.H. and Mishchenko, A. and Bandurin, Denis A. and Morozov, S.V. and Cao, Y. and Khestanova, E. and Ben Shalom, M. and Kretinin, A.V. and Novoselov, K.S. and Eaves, Laurence and Grigorieva, Irina V. and Ponomarenko, L.A. and Fal’ko, V.I. and Geim, A.K. (2017) High-temperature quantum oscillations caused by recurring Bloch states in graphene superlattices. Science, 357 (6347). pp. 181-184. ISSN 1095-9203

Chen, X. and Ashcroft, Ian and Wildman, Ricky D. and Tuck, Christopher (2017) A combined inverse finite element – elastoplastic modelling method to simulate the size-effect in nanoindentation and characterise materials from the nano to micro-scale. International Journal of Solids and Structures, 104-105 . pp. 25-34. ISSN 0020-7683

Mudd, G.W. and Molas, M.R. and Chen, X. and Zólyomi, V. and Nogajewski, K. and Kudrynskyi, Zakhar R. and Kovalyuk, Zakhar D. and Yusa, G. and Makarovsky, Oleg and Eaves, Laurence and Potemski, M. and Fal'ko, V.I. and Patanè, Amalia (2016) The direct-to-indirect band gap crossover in two-dimensional van der Waals Indium Selenide crystals. Scientific Reports, 6 (39619). pp. 1-10. ISSN 2045-2322

Chen, X. and Ashcroft, I. and Wildman, Ricky D. and Tuck, Christopher (2015) An inverse method for determining the spatially resolved properties of viscoelastic–viscoplastic three-dimensional printed materials. Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences, 471 (2183). 20150477/1-20150477/23. ISSN 1471-2946

Sedman, V.L. and Chen, X. and Allen, S. and Roberts, C.J. and Korolkov, V.V. and Tendler, S.J.B. (2013) Tuning the mechanical properties of self-assembled mixed-peptide tubes. Journal of Microscopy, 249 (3). pp. 165-172. ISSN 0022-2720

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