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Jump to: Article Number of items: 1. ArticleRomano, Gianpaolo and Fayyaz, Asad and Riccio, Michele and Maresca, Luca and Breglio, Giovanni and Castellazzi, Alberto and Irace, Andrea (2016) A comprehensive study of the short-circuit ruggedness of silicon carbide power MOSFETs. IEEE Journal of Emerging and Selected Topics in Power Electronics, 4 (3). pp. 978-987. ISSN 2168-6785 |