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Jump to: Article Number of items: 1. ArticleIuras, Andrea and Scurr, David J. and Boissier, Catherine and Nicholas, Mark L. and Roberts, Clive J. and Alexander, Morgan R. (2016) Imaging of crystalline and amorphous surface regions using time-of-flight secondary-ion mass spectrometry (ToF-SIMS): application to pharmaceutical materials. Analytical Chemistry, 88 . pp. 3481-3487. ISSN 1520-6882 |
