Widefield two laser interferometry

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Patel, Rikesh, Achamfuo-Yeboah, Samuel, Light, Roger A. and Clark, Matt (2014) Widefield two laser interferometry. Optics Express, 22 (22). pp. 27094-27101. ISSN 1094-4087

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Official URL: https://www.osapublishing.org/oe/abstract.cfm?uri=oe-22-22-27094

Abstract

A novel system has been developed that can capture the wide- field interference pattern generated by interfering two independent and incoherent laser sources. The interferograms are captured using a custom CMOS modulated light camera (MLC) which is capable of demodulating light in the megahertz region. Two stabilised HeNe lasers were constructed in order to keep the optical frequency difference (beat frequency) between the beams within the operational range of the camera.

This system is based on previously reported work of an ultrastable heterodyne interferometer [Opt. Express 20, 17722 (2012)]. The system used an electronic feedback system to mix down the heterodyne signal captured at each pixel on the camera to cancel out the effects of time varying piston phase changes observed across the array. In this paper, a similar technique is used to track and negate the effects of beat frequency variations across the two laser pattern. This technique makes it possible to capture the full field interferogram caused by interfering two independent lasers even though the beat frequency is effectively random.

As a demonstration of the system’s widefield interferogram capture capability, an image of a phase shifting object is taken using a very simple two laser interferometer.

Item Type:	Article
RIS ID:	https://nottingham-repository.worktribe.com/output/737752
Additional Information:	© 2014 Optical Society of America. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited.
Schools/Departments:	University of Nottingham, UK > Faculty of Engineering University of Nottingham, UK > Faculty of Engineering > Department of Electrical and Electronic Engineering
Identification Number:	https://doi.org/10.1364/OE.22.027094
Depositing User:	Patel, Dr Rikesh
Date Deposited:	18 Jul 2017 14:04
Last Modified:	04 May 2020 16:55
URI:	https://eprints.nottingham.ac.uk/id/eprint/44219

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