Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy

Patel, Rikesh and Li, Wenqi and Smith, Richard J. and Sharples, Steve D. and Clark, Matt (2017) Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy. Scripta Materialia, 140 . pp. 67-70. ISSN 1359-6462

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Abstract

Due to its economical production process polysilicon, or multicrystalline silicon, is widely used to produce solar cell wafers. However, the conversion efficiencies are often lower than equivalent monocrystalline or thin film cells, with the structure and orientation of the silicon grains strongly linked to the efficiency. We present a non-destructive laser ultrasonic inspection technique, capable of characterising large (52 x 76 mm2) photocell's microstructure – measurement times, sample surface preparation and system upgrades for silicon scanning are discussed. This system, known as spatially resolved acoustic spectroscopy (SRAS) could be used to optimise the polysilicon wafer production process and potentially improve efficiency.

Item Type: Article
RIS ID: https://nottingham-repository.worktribe.com/output/965137
Keywords: Acoustic methods, Solar cells, Crystal structure, Microstructure, Nondestructive testing
Schools/Departments: University of Nottingham, UK > Faculty of Engineering
Identification Number: https://doi.org/10.1016/j.scriptamat.2017.07.003
Depositing User: Eprints, Support
Date Deposited: 14 Jul 2017 14:10
Last Modified: 04 May 2020 19:54
URI: http://eprints.nottingham.ac.uk/id/eprint/44204

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