A double end fault location technique for distribution systems based on fault-generated transients

Aboshady, F.M. and Sumner, Mark and Thomas, David W.P. (2017) A double end fault location technique for distribution systems based on fault-generated transients. In: 2017 IEEE 26th International Symposium on Industrial Electronics (ISIE), 19-21 June 2017, Edinburgh, Scotland, UK.

[img]
Preview
PDF - Requires a PDF viewer such as GSview, Xpdf or Adobe Acrobat Reader
Download (642kB) | Preview

Abstract

This paper presents a fault location technique for distribution systems. It is a two end impedance based technique that uses the fault generated transients to estimate the fault distance over a broad range of frequencies. Then, curve fitting is applied to find the final estimated fault distance. Firstly, the paper introduces the method for the system represented as a lumped RL model. Then, generalized to consider the distribution line capacitance. The technique accounts for presence of loading taps, heterogeneous feeder sections, single phase, two phase and three phase loads and unbalance in distribution system. Single line to ground, line to line, and three phase faults are considered at different fault resistance values up to 100 Ω. Also, the effect of fault inception angle and resolution of analogue to digital converter is investigated. IEEE 34 nodes system is used to evaluate the proposed method.

Item Type: Conference or Workshop Item (Paper)
Additional Information: © 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. Published in: Proceedings 2017 IEEE 26th International Symposium on Industrial Electronics (ISIE), IEEE, p. 32-36. doi:10.1109/ISIE.2017.8001219. ISSN 2163-5145.
Keywords: fault location; fault transients; impedance based techniques
Schools/Departments: University of Nottingham, UK > Faculty of Engineering > Department of Electrical and Electronic Engineering
Related URLs:
Depositing User: Burns, Rebecca
Date Deposited: 28 Jun 2017 13:23
Last Modified: 12 Oct 2017 23:51
URI: http://eprints.nottingham.ac.uk/id/eprint/43806

Actions (Archive Staff Only)

Edit View Edit View