In-situ fabrication of gold nanoparticle functionalized probes for tip-enhanced Raman spectroscopy by dielectrophoresis

Sweetenham, Claire Sue and Woolley, Richard A. J. and Notingher, Ioan (2016) In-situ fabrication of gold nanoparticle functionalized probes for tip-enhanced Raman spectroscopy by dielectrophoresis. Journal of Nanophotonics, 10 (3). 030502. ISSN 1934-2608

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Abstract

We report the use of dielectrophoresis to fabricate in-situ probes for tip-enhanced Raman spectroscopy (TERS) based on Au nanoparticles. A typical conductive atomic force microscope (AFM) was used to functionalize iridium-coated conductive silicon probes with Au nanoparticles of 10-nm diameter. Suitable TERS probes can be rapidly produced (30 to 120 s) by applying a voltage of 10 Vpp at a frequency of 1 MHz. The technique has the advantage that the Au-based probes are ready for immediate use for TERS measurements, minimizing the risks of tip contamination and damage during handling. Scanning electron microscopy and energy dispersive x-ray spectroscopy were used to confirm the quality of the probes, and used samples of p-ATP monolayers on silver substrates were used to demonstrate experimentally TERS measurements.

Item Type: Article
Keywords: tip-enhanced Raman spectroscopy; dielectrophoresis; gold nanoparticles
Schools/Departments: University of Nottingham UK Campus > Faculty of Science > School of Physics and Astronomy
Identification Number: https://doi.org/10.1117/1.JNP.10.030502
Depositing User: Eprints, Support
Date Deposited: 01 Sep 2016 14:09
Last Modified: 13 Sep 2016 12:29
URI: http://eprints.nottingham.ac.uk/id/eprint/36186

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