Quadrature wavelength scanning interferometry

Moschetti, Giuseppe and Forbes, Alistair and Leach, Richard K. and Jiang, Xiang and O’Connor, Daniel (2016) Quadrature wavelength scanning interferometry. Applied Optics, 55 (20). pp. 5332-5340. ISSN 2155-3165

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A novel method to double the measurement range of wavelength scanning interferometry (WSI) is described. In WSI the measured optical path difference (OPD) is affected by a sign ambiguity, i.e. from an interference signal it is not possible to distinguish whether the OPD is positive or negative. The sign ambiguity can be resolved by measuring an interference signal in quadrature. A method to obtain a quadrature interference signal for WSI is described and a theoretical analysis of the advantages is reported. Simulations of the advantages of the technique and of signal errors due to non-ideal quadrature are discussed. The analysis and simulation are supported by experimental measurements to show the improved performances.

Item Type: Article
Additional Information: © 2016 Optical Society of America. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited.
Schools/Departments: University of Nottingham UK Campus > Faculty of Engineering
Identification Number: https://doi.org/10.1364/AO.55.005332
Depositing User: Eprints, Support
Date Deposited: 18 Jul 2016 10:34
Last Modified: 13 Sep 2016 13:48
URI: http://eprints.nottingham.ac.uk/id/eprint/35132

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