Control theory for scanning probe microscopy revisited

Stirling, Julian (2014) Control theory for scanning probe microscopy revisited. Beilstein Journal of Nanotechnology, 5 . pp. 337-345. ISSN 2190-4286

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Abstract

We derive a theoretical model for studying SPM feedback in the context of control theory. Previous models presented in the literature that apply standard models for proportional-integral-derivative controllers predict a highly unstable feedback environment. This model uses features specific to the SPM implementation of the proportional-integral controller to give realistic feedback behaviour. As such the stability of SPM feedback for a wide range of feedback gains can be understood. Further consideration of mechanical responses of the SPM system gives insight into the causes of exciting mechanical resonances of the scanner during feedback operation.

Item Type: Article
Additional Information: This article is part of the Thematic Series "Advanced atomic force microscopy techniques II".
Keywords: AFM; control theory; feedback; scanning probe microscopy
Schools/Departments: University of Nottingham UK Campus > Faculty of Science > School of Physics and Astronomy
Identification Number: https://doi.org/10.3762/bjnano.5.38
Depositing User: Eprints, Support
Date Deposited: 15 Feb 2016 12:37
Last Modified: 15 Sep 2016 01:52
URI: http://eprints.nottingham.ac.uk/id/eprint/31694

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