Rapid wide-field heterodyne interferometry with custom 2D CMOS camera

Zhang, J. and See, C.W. and Smith, R.J. and Johnston, N.S. and Pitter, M.C. and Somekh, M.G. and Light, R.A. (2015) Rapid wide-field heterodyne interferometry with custom 2D CMOS camera. Electronics Letters, 51 (6). pp. 479-480. ISSN 0013-5194

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Abstract

A wide-field pseudo-heterodyne interference contrast microscope is described, which employs a complementary metal–oxide semiconductor (CMOS) phase-sensitive camera. The use of multiple wells in the camera enables extremely rapid measurement of a full phase field at high resolution and the modulation frequency is not limited by the camera frame rate. The high data acquisition frequency allows the effects of microphonics to be frozen to mitigate the effect of low-frequency disturbance.

Item Type: Article
Keywords: heterodyne detection; CMOS image sensors; optical microscopes; light interferometry
Schools/Departments: University of Nottingham UK Campus > Faculty of Engineering > Department of Electrical and Electronic Engineering
Identification Number: https://doi.org/10.1049/el.2015.0268
Depositing User: Light, Roger
Date Deposited: 06 Jul 2015 09:31
Last Modified: 13 Sep 2016 15:26
URI: http://eprints.nottingham.ac.uk/id/eprint/29254

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