Phonon scattering by impurities in semiconductors
Ramdane, Abderrahim (1980) Phonon scattering by impurities in semiconductors. PhD thesis, University of Nottingham.
Thermal conductivity measurements have been used to study the low lying energy levels of Cr ions in GaAs. Strong resonant phonon scattering was observed in semi-insulating (SI) and p-type samples, which is attributed to Cr 2+ or Cr 3+ ions, while the scattering in the n-type samples additional to that in undoped material was very small. From the computer fits of the thermal conductivity, zero-field ground state splittings have been deduced. A splitting at ~ 23 cm -1 is attributed to Cr 3+ ions, others at ~ 0.7 cm and 4.9 cm are due to Cr 2+.
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