Surface plasmon microscopic sensing with beam profile modulation

Zhang, Bei and Pechprasarn, Suejit and Somekh, Michael G. (2012) Surface plasmon microscopic sensing with beam profile modulation. Optics Express, 20 (27). pp. 28039-28048. ISSN 1094-4087

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Abstract

Surface Plasmon microscopy enables measurement of local refractive index on a far finer scale than prism based systems. An interferometric or confocal system gives the so-called V(z) curve when the sample is scanned axially, which gives a measure of the surface plasmon propagation velocity. We show how a phase spatial light modulator (i) performs the necessary pupil function apodization (ii) imposes an angular varying phase shift that effectively changes sample defocus without any mechanical movement and (iii) changes the relative phase of the surface plasmon and reference beam to provide signal enhancement not possible with previous configurations.

Item Type: Article
Schools/Departments: University of Nottingham UK Campus > Faculty of Engineering
Depositing User: Grogan, Mrs Jane
Date Deposited: 04 Apr 2014 12:03
Last Modified: 15 Sep 2016 03:14
URI: http://eprints.nottingham.ac.uk/id/eprint/2869

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