Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN

Moldovan, Grigore and Harrison, Ian and Roe, Martin and Brown, Paul D. (2004) Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN. In: Electron microscopy and analysis 2003: proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003. Institute of Physics conference series (179). Institute of Physics Publishing, Bristol, pp. 115-118. ISBN 0750309679

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Abstract

A correlated current-voltage (I-V), electron beam induced conductivity (EBIC) and X-ray photoelectron spectroscopy (XPS) study of Au contacts to KOH treated n-type GaN is presented. A strong degradation of I-V characteristics occurs following the KOH treatment, mirrored in a reduction in the magnitude of the EBIC current, even though the EBIC images look visibly unaltered. XPS demonstrates a modification in the surfaces states, e.g. resulting in a –0.3eV shift in the binding energy of Ga3d for MBE GaN following KOH processing.

Item Type:Book Section
Uncontrolled Keywords:I-V EBIC XPS GaN
Schools/Departments:University of Nottingham UK Campus > Faculty of Engineering > Department of Electrical and Electronic Engineering
ID Code:1444
Deposited By:Brown, Prof Paul D
Deposited On:25 Mar 2011 19:12
Last Modified:13 Aug 2013 08:42

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