Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN

Tools

Moldovan, Grigore, Harrison, Ian, Roe, Martin and Brown, Paul D. (2004) Correlation of electrical and structural properties of Au contacts to KOH treated n-GaN. In: Electron microscopy and analysis 2003: proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003. Institute of Physics conference series (179). Institute of Physics Publishing, Bristol, pp. 115-118. ISBN 0750309679

Full text not available from this repository.

Abstract

A correlated current-voltage (I-V), electron beam induced conductivity (EBIC) and X-ray photoelectron spectroscopy (XPS) study of Au contacts to KOH treated n-type GaN is presented. A strong degradation of I-V characteristics occurs following the KOH treatment, mirrored in a reduction in the magnitude of the EBIC current, even though the EBIC images look visibly unaltered. XPS demonstrates a modification in the surfaces states, e.g. resulting in a –0.3eV shift in the binding energy of Ga3d for MBE GaN following KOH processing.

Item Type:

Book Section

RIS ID:

https://nottingham-repository.worktribe.com/output/1021696

Keywords:

I-V EBIC XPS GaN

Schools/Departments:

University of Nottingham, UK > Faculty of Engineering > Department of Electrical and Electronic Engineering

Related URLs: