Time of flight mass spectrometry of pharmaceutical systems
Armitage Nolan, Jennifer Claire (2013) Time of flight mass spectrometry of pharmaceutical systems. PhD thesis, University of Nottingham.
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a widely used surface chemical analysis technique that is traditionally employed to characterise the first few molecular layers of a material interface. The ability of this technique to accurately reflect the surface chemistry of polymers, biomaterials and many other solid materials is well documented. However, the majority of research that utilises this technique is based upon a qualitative rather than quantitative assessment of the material under investigation.
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